Table Of Contents

DAQ PlotPreferencesDevice ► Test

The Test Device is used to demonstrate features of DAQ Plot, see the Simulation tutorial to learn how to activate this feature. The test preference pane is shown below.

The test device can be useful to test methodology for data storage and analysis without having hardware.

The following details the Test parameters.

Notice how the Test signal has no Apply button, unlike Hardware Preference panes. That is because the parameters of the test signal are orthogonal, meaning one state does not invalidate another state. That is unlike programing DAQ hardware states where the states must be consistent with each other. Because the state of the test signals is applied when changed you can alter them dynamically and see the result in the plot output which also permits experimentation of the attributes in real time as they apply to more complex processing of the Derived parameters.

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